2, FIG. 3, etc. Example: FIG. 1. Concentration dependence of the critical indentation depth, hc. Labels appear before what they describe. Example: (a) SEM micrograph, (b) TEM micrograph, and (c) XRD ...
To use EBSD a beam of electrons is fired on the point of interest of a crystalline sample, which is tilted at approximately 70° to the normal incidence of the electron beam in the SEM; this is to ...
1. Select Analysis mode in the Column SetUp window. The working distance should be 12 mm, the default position. 2. Set the accelerating voltage to achieve at least 2x over-voltage, usually 20 kV. 3.