2 Methods frequently utilized for nanomaterial characterization include scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), and X-ray diffraction ...
2, FIG. 3, etc. Example: FIG. 1. Concentration dependence of the critical indentation depth, hc. Labels appear before what they describe. Example: (a) SEM micrograph, (b) TEM micrograph, and (c) XRD ...
To use EBSD a beam of electrons is fired on the point of interest of a crystalline sample, which is tilted at approximately 70° to the normal incidence of the electron beam in the SEM; this is to ...