2 Methods frequently utilized for nanomaterial characterization include scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), and X-ray diffraction ...
Thermo Fisher Scientific Inc introduced the Thermo Scientific™ Iliad™ (Scanning) Transmission Electron Microscope (S)TEM at the European Microscopy Congress 2024 in Copenhagen, Denmark. This ...
The microstructural morphology, structural features, full-width at half-maximum, microhardness, and surface roughness of the stainless steel welded joint specimens before and after LSP were ...
The X-Ray and Electron Microscopy Lab (XEML) hosts significant materials characterization capacity, with capabilities including TEM, SEM, XRD, optical microscopy and XRF. The lab also has sample ...